A unified charge model for symmetric double-gate and surrounding-gate MOSFETs

被引:23
|
作者
Lu, Huaxin [1 ]
Yu, Bo [1 ]
Taur, Yuan [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92037 USA
关键词
double-gate MOSFET; surrounding-gate MOSFET; analytical potential model; unified charge model; compact modeling;
D O I
10.1016/j.sse.2007.06.018
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a unified analytical charge model for long channel symmetric double-gate (DG) and surrounding-gate (SGT) MOSFETs. The proposed analytical charge model continuously covers all the operation regions and achieves both computation efficiency and high accuracy. Unified intrinsic capacitance model for both DG and SGT MOSFETs is also presented for AC simulation. A detailed comparison between the analytical model and numerical solution is conducted to demonstrate the accuracy of the model. (C) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:67 / 72
页数:6
相关论文
共 50 条
  • [31] Analytic Model for Undoped Symmetric Double-Gate MOSFETs With Small Gate-Oxide-Thickness Asymmetry
    Chang, Sheng
    Wang, Gaofeng
    Huang, Qijun
    Wang, Hao
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (10) : 2297 - 2301
  • [32] Vertical double-gate MOSFETs
    Moers, J
    Trellenkamp, S
    Marso, M
    van der Hart, A
    Mantl, S
    Lüth, H
    Kordos, P
    ASDAM 2004: THE FIFTH INTERNATIONAL CONFERENCE ON ADVANCED SEMICONDUCTOR DEVICES AND MICROSYSTEMS, 2004, : 215 - 218
  • [33] Unified Quantum and Reliability Model for Ultra-Thin Double-Gate MOSFETs
    ElKashlan, Rana Y.
    Samy, Omnia
    Anis, Azza
    Ismail, Yehea
    Abdelhamid, Hamdy
    SILICON, 2020, 12 (01) : 21 - 28
  • [34] Drain current model including velocity saturation for symmetric double-gate MOSFETs
    Hariharan, Venkatnarayan
    Vasi, Juzer
    Rao, V. Ramgopal
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (08) : 2173 - 2180
  • [35] A Compact Interface-Trapped-Charge-Induced Subthreshold Current Model for Surrounding-Gate MOSFETs
    Chiang, Te-Kuang
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2014, 14 (02) : 766 - 768
  • [36] Compact modeling of quantum effects in symmetric double-gate MOSFETs
    Wang, Wei
    Lu, Huaxin
    Song, Jooyoung
    Lo, Shih-Hsien
    Taur, Yuan
    MICROELECTRONICS JOURNAL, 2010, 41 (10) : 688 - 692
  • [37] Continuous analytic I-V model for surrounding-gate MOSFETs
    Jiménez, D
    Iñíguez, B
    Suñé, J
    Marsal, LF
    Pallarès, J
    Roig, J
    Flores, D
    IEEE ELECTRON DEVICE LETTERS, 2004, 25 (08) : 571 - 573
  • [38] Unified Regional Surface Potential for Modeling Common-Gate Symmetric/Asymmetric Double-Gate MOSFETs with Any Body Doping
    See, Guan Huei
    Zhou, Xing
    Zhu, Guojun
    Zhu, Zhaomin
    Lin, Shihuan
    Wei, Chengqing
    Zhang, Junbin
    Srinivas, Ashwin
    NSTI NANOTECH 2008, VOL 3, TECHNICAL PROCEEDINGS: MICROSYSTEMS, PHOTONICS, SENSORS, FLUIDICS, MODELING, AND SIMULATION, 2008, : 770 - +
  • [39] An Improvement of Analytical I-V Model for Surrounding-Gate MOSFETs
    Alkoash, Abedalkhem
    Sasic, Rajko M.
    Ostojic, Stanko M.
    Lukic, Petar M.
    JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 2011, 8 (01) : 47 - 50
  • [40] Charge-based analytical current model for asymmetric Double-Gate MOSFETs
    Park, JS
    Lee, S
    Jhee, Y
    Shin, H
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2005, 47 : S392 - S396