Three-dimensional mapping of stresses in plastically deformed diamond using micro-Raman and photoluminescence spectroscopy

被引:10
|
作者
Erasmus, R. M. [1 ,2 ,3 ]
Daniel, R. D. [4 ]
Comins, J. D. [1 ,2 ,3 ]
机构
[1] Univ Witwatersrand, Sch Phys, Raman & Luminescence Lab, ZA-2050 Wits, South Africa
[2] Univ Witwatersrand, DST NRF Ctr Excellence Strong Mat, ZA-2050 Wits, South Africa
[3] Univ Witwatersrand, Sch Phys, Mat Phys Res Inst, ZA-2050 Wits, South Africa
[4] Univ Hull, Sch Engn, Kingston Upon Hull HU6 7RX, N Humberside, England
基金
新加坡国家研究基金会;
关键词
Shear stress - Silicon compounds - Diamonds - Drawing dies - Piles - Surface defects - Photoluminescence spectroscopy - Dislocations (crystals) - Photoluminescence;
D O I
10.1063/1.3531548
中图分类号
O59 [应用物理学];
学科分类号
摘要
The extreme mechanical properties of diamond have made it the material of choice for many industrial applications, ranging from cutting and grinding to wire-drawing dies. A detailed knowledge of its mechanical properties, also at high temperature, is thus of importance. Micro-Raman and photoluminescence (PL) spectroscopy were used to map the three-dimensional (3D) stress distribution surrounding a plastic impression made in a synthetic, type Ib single crystal diamond. The impression was created on a (100) face of the crystal with an Si(3)N(4) impressor at 1400 C using the so-called soft impressor technique. The diamond Raman peak was mapped at room temperature at the surface and at fixed intervals of 10 mu m below the surface using a motorised X-Y stage. The depth (Z)-resolution was limited to 10 mu m by means of a confocal pinhole. Using data from the Raman peak position, a 3D map of the stress contours surrounding the impression was generated, while the Raman width data yielded a map of the plastic deformation volume. The surface stress map shows a cross-shaped rosette pattern that corresponds very closely with micrographs imaging the pile-up on the surface due to dislocation movement. The "arms" of the pattern are in compression (similar to 1.5 GPa), while the center of the impression is in tension (similar to 1 GPa). The deformation map shows a radially symmetric area of deformation centered on the impression, with the maximum degree of deformation at the center. The stress contours compare favorably with the resolved shear stress contours calculated for diamond. PL intensity maps of the zero phonon line (ZPL) associated with the [N-V](-) defect center at 1.945 eV provide images of the extent of vacancy formation and movement during the impression process. Data concerning the position and width of the ZPL correspond well with the Raman results. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3531548]
引用
收藏
页数:11
相关论文
共 50 条
  • [41] Characterisation of mechanical stresses of device isolation structures by Micro-Raman spectroscopy and modelling
    Jones, SK
    Ahmed, M
    Bazley, DJ
    Beanland, RJ
    De Wolf, I
    Hill, C
    Rothwell, WJ
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 1999, 99 (16): : 60 - 75
  • [42] Microplastics detected in three types of female reproductive organs using micro-Raman spectroscopy
    Dong, Chunlin
    Xu, Hongwen
    Lin, Yaying
    Zhang, Bing
    Yu, Zhilong
    Xie, Yunfei
    Ma, Ding
    Yu, Jinjin
    ECOTOXICOLOGY AND ENVIRONMENTAL SAFETY, 2024, 285
  • [43] Orientation Mapping of Extruded Polymeric Composites by Polarized Micro-Raman Spectroscopy
    Chen, Xiaoyun
    Leugers, M. Anne
    Kirch, Tim
    Stanley, Jamie
    JOURNAL OF SPECTROSCOPY, 2015, 2015 : 1 - 7
  • [44] Investigation of vibrational and photoluminescence spectra of nanocrystalline silicon by micro-Raman spectroscopy using various laser powers
    Khoi, PH
    Tam, NTT
    Duong, PH
    Nghia, NX
    JOURNAL OF RAMAN SPECTROSCOPY, 1999, 30 (05) : 385 - 389
  • [45] Dopant mapping and strain analysis in B doped silicon structures using micro-Raman spectroscopy
    Bowden, M
    Gardiner, DJ
    Lourenço, MA
    Hedley, J
    Wood, D
    Burdess, JS
    Harris, AJ
    MICROELECTROMECHANICAL STRUCTURES FOR MATERIALS RESEARCH, 1998, 518 : 239 - 244
  • [46] Spatial distribution and content detection of gefitinib in tablets using confocal micro-raman spectroscopy mapping
    Ma, Li
    Zhou, Chun-Hua
    Yang, Bo
    Han, Xu
    Cui, Ying-Chun
    MATERIALS EXPRESS, 2020, 10 (09) : 1444 - 1451
  • [47] Fibre interactions in two-dimensional composites by micro-Raman spectroscopy
    Wagner, HD
    Amer, MS
    Schadler, LS
    JOURNAL OF MATERIALS SCIENCE, 1996, 31 (05) : 1165 - 1173
  • [48] Characterization of uranium oxides using in situ micro-Raman spectroscopy
    Palacios, ML
    Taylor, SH
    APPLIED SPECTROSCOPY, 2000, 54 (09) : 1372 - 1378
  • [49] Iron corrosion product identification using micro-raman spectroscopy
    Makus, KE
    Vikesland, PJ
    GEOCHIMICA ET COSMOCHIMICA ACTA, 2003, 67 (18) : A270 - A270
  • [50] Mapping the composition of chondritic meteorite Northwest Africa 3118 with micro-Raman spectroscopy
    Dall'Asen, Analia G.
    Dimas, Sophia I.
    Tyler, Sarah
    Johnston, Jessica F.
    Anderton, Timothy R.
    Ivans, Inese I.
    Gerton, Jordan M.
    Bromley, Benjamin C.
    Kenyon, Scott J.
    SPECTROSCOPY LETTERS, 2017, 50 (08) : 417 - 425