Substrate Effects on Terahertz Metamaterial Resonances for Various Metal Thicknesses

被引:12
|
作者
Park, S. J. [1 ]
Ahn, Y. H.
机构
[1] Ajou Univ, Dept Phys, Suwon 443749, South Korea
基金
新加坡国家研究基金会;
关键词
Terahertz spectroscopy; Metamaterials; Near-field Amplification; RING RESONATOR METAMATERIALS; DEVICES; FILM;
D O I
10.3938/jkps.65.1843
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We demonstrate dielectric substrate effects on the resonance shift of terahertz metamaterials with various metal thicknesses by using finite-difference time-domain simulations. We found a small red shift in the metamaterial resonance with increasing metal thickness for the free-standing case. Conversely, when the metamaterial pattern was supported by a substrate with a high dielectric constant, the resonant frequency exhibited a large blue shift because the relative contribution of the substrate's refractive index to the resonant frequency decreased drastically as we increased the metal thickness. We determined the substrate's refractive index, 1.26, at which the metamaterial resonance was independent of the metal thickness. We extracted the effective refractive index as a function of the substrate's refractive index explicitly, which was noticeably different for different film thicknesses.
引用
收藏
页码:1843 / 1847
页数:5
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