SiC Power Device Reliability

被引：0
|
作者：
Gajewski, Don [1 ]
机构：
[1] CREE, Wolfspeed, Durham, NC 27709 USA
来源：
2016 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW) | 2016年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：xi / xi
页数：1
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