Influence of Conversion Material Morphology on Electrochemistry Studied with Operando X-Ray Tomography and Diffraction

被引：47
|
作者：
Villevieille, Claire [1 ]
Ebner, Martin [2 ]
Gomez-Camer, Juan Luis [1 ]
Marone, Federica [3 ]
Novak, Petr [1 ]
Wood, Vanessa [2 ]
机构：
[1] PSI, Electrochem Lab, CH-5232 Villigen, Switzerland
[2] Swiss Fed Inst Technol, Lab Nanoelect, CH-8092 Zurich, Switzerland
[3] PSI, Swiss Light Source, CH-5232 Villigen, Switzerland
来源：
ADVANCED MATERIALS | 2015年 / 27卷 / 10期
关键词：
LITHIUM-ION BATTERIES; ALLOY ANODES; SILICON; DEGRADATION; MICROSCOPY; LITHIATION; NANOSCALE;
D O I：
10.1002/adma.201403792
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
[No abstract available]
引用
收藏
页码：1676 / +
页数：7
相关论文
共 50 条
  • [41] X-ray diffraction tomography using interference effects
    Universidade do Estado do Rio de, Janeiro, Rio de Janeiro, Brazil
    Nucl Instrum Methods Phys Res Sect A, 2-3 (458-464):
  • [42] Coding and sampling for compressive x-ray diffraction tomography
    Greenberg, Joel A.
    Krishnamurthy, Kalyani
    Lakshmanan, Manu
    MacCabe, Kenneth
    Wolter, Scott
    Kapadia, Anuj
    Brady, David
    WAVELETS AND SPARSITY XV, 2013, 8858
  • [43] X-ray diffraction tomography employing an annular beam
    Evans, Paul
    Rogers, Keith
    Dicken, Anthony
    Godber, Simon
    Prokopiou, Danae
    OPTICS EXPRESS, 2014, 22 (10): : 11930 - 11944
  • [44] X-ray diffraction tomography: Image reconstruction and applications
    Grant, JA
    Davis, JR
    Morgan, MJ
    Wells, P
    TRENDS IN NDE SCIENCE AND TECHNOLOGY - PROCEEDINGS OF THE 14TH WORLD CONFERENCE ON NDT (14TH WCNDT), VOLS 1-5, 1996, : 1427 - 1430
  • [45] X-ray diffraction tomography using interference effects
    Barroso, RC
    Lopes, RT
    Goncalves, OD
    de Assis, JT
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1998, 418 (2-3): : 458 - 464
  • [46] A new theoretical approach to x-ray diffraction tomography
    Pavlov, KM
    Kewish, CM
    Davis, JR
    Morgan, MJ
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (13) : 1596 - 1605
  • [47] Structured illumination for compressive x-ray diffraction tomography
    Greenberg, Joel A.
    Brady, David J.
    COMPUTATIONAL IMAGING XII, 2014, 9020
  • [48] Combining operando synchrotron X-ray tomographic microscopy and scanning X-ray diffraction to study lithium ion batteries
    Pietsch, Patrick
    Hess, Michael
    Ludwig, Wolfgang
    Eller, Jens
    Wood, Vanessa
    SCIENTIFIC REPORTS, 2016, 6
  • [49] In Operando X-ray Diffraction Study of Thermoelectric Cu2Se
    Stubkjaer, Rasmus B.
    Thorup, Peter S.
    Jorgensen, Lasse R.
    Roelsgaard, Martin
    Fischer, Karl F. F.
    Dippel, Ann-Christin
    Iversen, Bo Brummerstedt
    CHEMISTRY OF MATERIALS, 2024, 36 (18) : 8782 - 8791
  • [50] Mapping the coke formation within a zeolite catalyst extrudate in space and time by operando computed X-ray diffraction tomography
    Wragg, David S.
    Kalantzopoulos, Georgios N.
    Pappas, Dimitrios K.
    Pinilla-Herrero, Irene
    Rojo-Gama, Daniel
    Redekop, Evgeniy
    Di Michiel, Marco
    Beato, Pablo
    Lundegaard, Lars F.
    Svelle, Stian
    JOURNAL OF CATALYSIS, 2021, 401 : 1 - 6
12345