Far infrared (THz) electroluminescence from Si/SiGe quantum cascade heterostructures

There is strong interest in the development of sources that emit radiation in the far infrared (1-10 THz) frequency range for applications which include early detection of skin cancer, dental imaging, telecommunications, security scanning, gas sensing, astronomy, molecular spectroscopy, and the possible detection of biological weapons. While a number of THz sources are available, there are at present no compact, efficient, cheap and practical high-power solid-state sources such as light emitting diodes or lasers. Silicon is an excellent candidate for such a THz source since the lack of polar optical phonon scattering makes it an inherently low loss material at these frequencies. Furthermore, since over 97% of all microelectronics is presently silicon based; the realisation of a silicon based emitter/laser could potentially allow integration with conventional silicon-based microelectronics. In this paper THz electroluminescence from a Si/SiGe quantum cascade structure operating significantly above liquid helium temperatures is demonstrated. Fourier transform infrared spectroscopy was performed using step scan spectrometer with a liquid helium cooled Si-bolometer for detection. Spectra are presented demonstrating intersubband electroluminescence at a number of different frequencies. These spectral features agree very well with the theoretically calculated intersubband transitions predicted for the structure.