Rib waveguides containing Si nanocrystals embedded in SiO2 for optical communication in the visible range.

被引:0
|
作者
Pellegrino, P [1 ]
Garrido, B [1 ]
Garcia, C [1 ]
Morante, JR [1 ]
机构
[1] Univ Barcelona, Dept Elect, EME, E-08028 Barcelona, Spain
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a study on characterization and modelling of the structural and optical properties of rib-loaded waveguides working in the 600-900 nrn spectral range. The active layer was produced by Si+ ion implantation into SiO2. Si-ncs were precipitated by annealing at 1100 degrees C, forming a 0.4 mu m thick core layer in the waveguide. The Si-nc density, size and visible emission and the effective refractive index of the active layer were determined by dedicated experiments. Light propagation in the waveguide was observed at 633 and 780 nm and losses of about 10 dB/cm were been related to specific contributions, mostly geometric-related, and asymptotic values of 2 dB/cm for Mie scattering and 4 dB/cm for direct absorption were evaluated, which are promising for the feasibility of a competitive optical amplifier.
引用
收藏
页码:327 / 330
页数:4
相关论文
共 50 条
  • [41] Optical and Electrical Properties of Si Nanocrystals Embedded in SiO 2 Layers
    Lee, Sejoon
    Shim, Young Suk
    CHo, Hoon Young
    Kim, Deuk Young
    Kim, Tae Whan
    Wang, Kang L.
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2003, 42 (12): : 7180 - 7183
  • [42] Influence of doping on the optical properties of silicon nanocrystals embedded in SiO2
    Fregnaux, Mathieu
    Khelifi, Rim
    Le Gall, Yann
    Muller, Dominique
    Mathiot, Daniel
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 12, NO 1-2, 2015, 12 (1-2): : 80 - 83
  • [43] Optical properties of embedded ZnTe nanocrystals in SiO2 thin layer
    Ahmed, F.
    Naciri, A. En
    Grob, J. J.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2010, 207 (07): : 1619 - 1622
  • [44] Optical study of Si nanocrystals in Si/SiO2 layers by spectroscopic ellipsometry
    Naciri, AE
    Mansour, M
    Johann, L
    Grob, JJ
    Eckert, C
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 216 : 167 - 172
  • [45] Nematic liquid crystal channel waveguides embedded in SiO2/Si grooves
    d'Alessandro, A
    Bellini, B
    Beccherelli, R
    Manolis, IG
    Donisi, D
    Asquini, R
    PROCEEDINGS OF WFOPC 2005: 4TH IEEE/LEOS WORKSHOP ON FIBRES AND OPTICAL PASSIVE COMPONENTS, 2005, : 275 - 280
  • [46] Nanoindentation of si nanocrystals in SiO2
    Pok, W
    Bradby, J
    Elliman, R
    COMMAD 04: 2004 CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC MATERIALS AND DEVICES, PROCEEDINGS, 2005, : 335 - 337
  • [47] Reversible charging effects in SiO2 films containing Si nanocrystals
    Choi, SH
    Elliman, RG
    APPLIED PHYSICS LETTERS, 1999, 75 (07) : 968 - 970
  • [48] Charge storage effects in Si nanocrystals embedded in SiO2 thin films
    González-Varona, O
    Garrido, B
    Pérez-Rodriguez, A
    Bonafos, C
    Montserrat, J
    Morante, JR
    POLYCRYSTALLINE SEMICONDUCTORS IV MATERIALS, TECHNOLOGIES AND LARGE AREA ELECTRONICS, 2001, 80-81 : 243 - 248
  • [49] Electron spin resonance analysis of Si nanocrystals embedded in a SiO2 matrix
    Jivanescu, M.
    Stesmans, A.
    Godefroo, S.
    Zacharias, M.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2007, 9 (03): : 721 - 724
  • [50] Si Nanocrystals Embedded in SiO2 Produced by Reactive Sputtering for Light Emission
    Mattos, A. E. P.
    Sombrio, G.
    Franzen, P. L.
    Pereira, M. B.
    Boudinov, H.
    MICROELECTRONICS TECHNOLOGY AND DEVICES - SBMICRO 2011, 2011, 39 (01): : 103 - 108