Using of Pulse Signals for DAC Testing

被引：0
|
作者：
Fexa, Pavel [1 ]
Vedral, Josef [1 ]
机构：
[1] Czech Tech Univ, Fac Elect Engn, Dept Measurement, CR-16635 Prague, Czech Republic
来源：
2011 INTERNATIONAL CONFERENCE ON APPLIED ELECTRONICS (AE) | 2011年
关键词：
DAC testing; impuls test signal; effective number of bit; signal-to-noise and distortion; short testing;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The qualities of the method for testing dynamic parameters of DACs using pulse signal sinx/x are analyzed in this paper. Practical examples are compared with standard Single and Multi-Tone Digital Fourier Transform Test Methods. This method finds an application in the industry in less demanding economical short testing.
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页数：4
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