Patent quality, firm value, and investor underreaction: Evidence from patent examiner busyness *
被引:14
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作者:
Shu, Tao
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机构:
Chinese Univ Hong Kong, Shenzhen Finance Inst, Sch Management & Econ, Shenzhen, Peoples R ChinaChinese Univ Hong Kong, Shenzhen Finance Inst, Sch Management & Econ, Shenzhen, Peoples R China
Shu, Tao
[1
]
Tian, Xuan
论文数: 0引用数: 0
h-index: 0
机构:
Tsinghua Univ, PBC Sch Finance, Beijing, Peoples R ChinaChinese Univ Hong Kong, Shenzhen Finance Inst, Sch Management & Econ, Shenzhen, Peoples R China
Tian, Xuan
[2
]
Zhan, Xintong
论文数: 0引用数: 0
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机构:
Fudan Univ, Sch Management, Shanghai, Peoples R ChinaChinese Univ Hong Kong, Shenzhen Finance Inst, Sch Management & Econ, Shenzhen, Peoples R China
Zhan, Xintong
[3
]
机构:
[1] Chinese Univ Hong Kong, Shenzhen Finance Inst, Sch Management & Econ, Shenzhen, Peoples R China
[2] Tsinghua Univ, PBC Sch Finance, Beijing, Peoples R China
[3] Fudan Univ, Sch Management, Shanghai, Peoples R China
This paper attempts to study the causal effect of examiner busyness on patent quality and firm value. Using a broad set of patent quality measures, we find strong evidence that patents allowed by busy examiners exhibit significantly lower quality. Further, examiner busyness of firms' patents negatively predicts the firms' future stock returns, which is consistent with investor underreaction to examiner busyness. Examiners' experience helps attenuate the negative effect of examiner busyness. (c) 2021 Elsevier B.V. All rights reserved.