Special Issue on International Conference on VLSI Design and Embedded Systems

被引：0

作者：

Basu, Kanad ^{[1
]}

Chen, Mingsong ^{[2
]}

Parekhji, Rubin ^{[3
]}

机构：

[1] Univ Texas Dallas, Richardson, TX 75083 USA

[2] East China Normal Univ, Sch Software Engn Inst, Shanghai, Peoples R China

[3] Texas Instruments Inc, Bangalore, Karnataka, India

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2019年 / 35卷 / 05期

关键词：

D O I：

10.1007/s10836-019-05836-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：579 / 580

页数：2

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