Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOx-Based Memristors - Part I: Behavioral Model

被引:4
|
作者
Vaidya, Dhirendra [1 ]
Kothari, Shraddha [1 ]
Abbey, Thomas [1 ]
Stathopoulos, Spyros [1 ]
Michalas, Loukas [1 ]
Serb, Alexantrou [1 ]
Prodromakis, Themis [1 ]
机构
[1] Univ Southampton, Ctr Elect Frontiers, Southampton SO17 1BJ, Hants, England
基金
英国工程与自然科学研究理事会;
关键词
Behavioral model; metal oxide memristors; pulsed resistance transient (PRT) measurements; resistive RAMs switching dynamics; temperature dependence; TiOx memristors; BOOLEAN LOGIC; DEVICE; CROSSBAR; MEMORY;
D O I
10.1109/TED.2021.3101996
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiOx memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiOx/Au and Pt/TiOx/Pt memristors.
引用
收藏
页码:4877 / 4884
页数:8
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