Large area interline CCD with low dark current

被引:4
|
作者
Parks, C [1 ]
Losee, D [1 ]
机构
[1] Eastman Kodak Co, Digital & Appl Imaging, Rochester, NY 14650 USA
来源
SENSORS AND CAMERA SYSTEMS FOR SCIENTIFIC, INDUSTRIAL, AND DIGITAL PHOTOGRAPHY APPLICATIONS IV | 2003年 / 5017卷
关键词
interline; CCD; dark current; image sensor; accumulation; noise;
D O I
10.1117/12.476796
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
When interline CCD image sensors increase in size beyond 4 million pixels, CCD dark current begins to degrade the signal. Some scientific and photographic applications use very slow readout rates (less than 1 MHz) to reduce the noise level. At a 1-MHz readout rate, a 4-megapixel imager will take at least 4 s to read out. This extended time period allows a significant amount of dark current, to build up and frustrate efforts to reduce noise. Often this situation leads to the additional expense of a low-temperature operation. The accumulation-mode readout method for interline CCD image sensors is being developed at Eastman Kodak Company. Previously, accumulation mode could only be applied to the full-frame architecture because the p-type substrate acted as a source for holes. Interline CCD image sensors with n-type substrates have no ready source of holes to accumulate the surface of the CCD under all phases. This problem has been overcome, allowing room-temperature operation without significant dark current generation.
引用
收藏
页码:167 / 175
页数:9
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