Transient Fault and Soft Error On-Die Monitoring Scheme

被引：11

作者：

Rossi, Daniele ^{[1
]}

Omana, Martin ^{[1
]}

Metra, Cecilia ^{[1
]}

机构：

[1] Univ Bologna, Dept Elect & Comp Sci DEIS, Bologna, Italy

来源：

2010 IEEE 25TH INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS (DFT 2010) | 2010年

关键词：

transient faults; early monitoring scheme; soft errors; LATCH;

D O I：

10.1109/DFT.2010.53

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.

引用

页码：391 / 398

页数：8

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