Transient Fault and Soft Error On-Die Monitoring Scheme

被引：11
|
作者：
Rossi, Daniele [1 ]
Omana, Martin [1 ]
Metra, Cecilia [1 ]
机构：
[1] Univ Bologna, Dept Elect & Comp Sci DEIS, Bologna, Italy
来源：
2010 IEEE 25TH INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS (DFT 2010) | 2010年
关键词：
transient faults; early monitoring scheme; soft errors; LATCH;
D O I：
10.1109/DFT.2010.53
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
引用
收藏
页码：391 / 398
页数：8
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