High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations

被引:156
|
作者
Britton, T. B. [1 ]
Wilkinson, A. J. [1 ]
机构
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
基金
英国工程与自然科学研究理事会;
关键词
EBSD; Electron backscatter diffraction; Deformation; Strain; SEM; Kinematics; BACK-SCATTER DIFFRACTION; ORIENTATION; DEFORMATION; MICROSCOPY; FIELD; DISTRIBUTIONS; PATTERNS; ALUMINUM; EBSD;
D O I
10.1016/j.ultramic.2012.01.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
In this paper we explore methods of measuring elastic strain variations in the presence of larger lattice rotations (up to similar to 11 degrees) using high resolution electron backscatter diffraction. We have examined the fundamental equations which relate pattern shifts to the elastic strain tensor and modified them to a finite deformation framework from the original infinitesimal deformation one. We incorporate the traction free boundary condition into the minimisation problem for the finite deformation case (i.e. large rotations and small elastic strains). Numerical experiments show that this finite deformation kinematic analysis continues to work well, while the infinitesimal analysis fails, when the misorientation between test and reference pattern is made increasingly high. However, measurements on patterns simulated using dynamical diffraction theory indicated that this formulation is not sufficient to recover elastic strains accurately because the pattern shifts are not determined accurately when large rotations are present. To overcome this issue we remap the test pattern to an orientation that is close to that of reference pattern. This remapping was defined by a finite rotation matrix, which was estimated from the infinitesimal rotation matrix measured using cross-correlation. A second cross-correlation analysis between the reference pattern and the remapped test pattern allows the elastic strains to be recovered using the much simpler infinitesimal deformation theory. We have also demonstrated that accurate recovery of elastic strains requires accurate knowledge of the pattern centre if this remapping algorithm is used. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:82 / 95
页数:14
相关论文
共 50 条
  • [21] J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
    Koko, Abdalrhaman
    Elmukashfi, Elsiddig
    Dragnevski, Kalin
    Wilkinson, Angus J.
    Marrow, Thomas James
    ACTA MATERIALIA, 2021, 218
  • [22] Crystal plasticity and high-resolution electron backscatter diffraction analysis of full-field polycrystal Ni superalloy strains and rotations under thermal loading
    Zhang, Tiantian
    Collins, David M.
    Dunne, Fionn P. E.
    Shollock, Barbara A.
    ACTA MATERIALIA, 2014, 80 : 25 - 38
  • [23] High Resolution Analysis of Intermetallic Compounds in Microelectronic Interconnects Using Electron Backscatter Diffraction and Transmission Electron Microscopy
    Krause, M.
    Maerz, B.
    Bennemann, S.
    Petzold, M.
    2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, : 591 - 598
  • [24] Residual-based pattern center calibration in high-resolution electron backscatter diffraction
    Zhong, Hongru
    Shi, Qiwei
    Chen, Zhe
    Dan, Chengyi
    Zhong, Shengyi
    Wang, Haowei
    MICRON, 2021, 146
  • [25] Mapping of Microscopic and Local Stress-Strain - Strain Curve Information by Combination of Digital Image Correlation and High-Resolution - Resolution Electron Backscatter Diffraction ff raction Methods
    Yamasaki, Shigeto
    Matsuo, Hirofumi
    Morikawa, Tatsuya
    Tanaka, Masaki
    JOURNAL OF THE JAPAN INSTITUTE OF METALS AND MATERIALS, 2024, 88 (09) : 216 - 225
  • [26] Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
    Britton, T. B.
    Maurice, C.
    Fortunier, R.
    Driver, J. H.
    Day, A. P.
    Meaden, G.
    Dingley, D. J.
    Mingard, K.
    Wilkinson, A. J.
    ULTRAMICROSCOPY, 2010, 110 (12) : 1443 - 1453
  • [27] A high-resolution serial sectioning specimen preparation technique for application to electron backscatter diffraction
    Wall, MA
    Schwartz, AJ
    Nguyen, L
    ULTRAMICROSCOPY, 2001, 88 (02) : 73 - 83
  • [28] Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
    Vilalta-Clemente, A.
    Naresh-Kumar, G.
    Nouf-Allehiani, M.
    Gamarra, P.
    di Forte-Poisson, M. A.
    Trager-Cowan, C.
    Wilkinson, A. J.
    ACTA MATERIALIA, 2017, 125 : 125 - 135
  • [29] BRAGG-DIFFRACTION OPTICS IN HIGH-RESOLUTION STRAIN-MEASUREMENTS
    VRANA, M
    LUKAS, P
    MIKULA, P
    KULDA, J
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 338 (01): : 125 - 131
  • [30] Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction
    Toda, A
    Ikarashi, N
    Ono, H
    JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) : 341 - 345