Suggested triple-series connection measurement tests of the ac quantized Hall resistance and the ac longitudinal resistance

被引：0

作者：

Cage, ME ^{[1
]}

Jeffery, A ^{[1
]}

Elmquist, RE ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

来源：

1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 1998年

关键词：

D O I：

10.1109/CPEM.1998.699941

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on equivalent circuit calculations a single ac ratio bridge can be used to accurately determine the ac quantized Hall resistance and to provide an independent value of the ac longitudinal resistance in a quantum Hall device. This may be achieved by making quantized Hall resistance measurements for two different combinations of triple-series connections to a standards-quality device.

引用

页码：341 / 342

页数：2

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