Suggested triple-series connection measurement tests of the ac quantized Hall resistance and the ac longitudinal resistance

被引：0
|
作者：
Cage, ME [1 ]
Jeffery, A [1 ]
Elmquist, RE [1 ]
机构：
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
来源：
1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 1998年
关键词：
D O I：
10.1109/CPEM.1998.699941
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Based on equivalent circuit calculations a single ac ratio bridge can be used to accurately determine the ac quantized Hall resistance and to provide an independent value of the ac longitudinal resistance in a quantum Hall device. This may be achieved by making quantized Hall resistance measurements for two different combinations of triple-series connections to a standards-quality device.
引用
收藏
页码：341 / 342
页数：2
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