Grazing incidence X-ray diffraction studies of thin films using an imaging plate detection system

被引:24
|
作者
Foran, GJ
Peng, JB
Steitz, R
Barnes, GT
Gentle, IR
机构
[1] UNIV QUEENSLAND,DEPT CHEM,BRISBANE,QLD 4072,AUSTRALIA
[2] AUSTRALIAN NUCL SCI & TECHNOL ORG,MENAI,NSW 2234,AUSTRALIA
关键词
D O I
10.1021/la950454n
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
First results of the grazing incidence X-ray diffraction patterns of cadmium arachidate Langmuir-Blodgett (LB) films measured using imaging plate detection are presented and discussed. The use of imaging plates has made possible the observation of diffraction peaks at far higher values of wavevector transfer than have been observed previously with other methods of detection, with a dramatic increase in signal-to-noise ratio. Values of in-plane d-spacing, area per molecule, and positional correlation length of the hexatic-B phase of a monolayer of cadmium arachidate are in excellent agreement with previous measurements. Multilayer LB films showed, in addition to the in-plane spots Q(110) and Q(200), sets of off-plane diffraction spots (Q(hkl), l > 0) which are observed up to a Q(2) value of 3.3 Angstrom(-1). Spots with both odd and even values of l are observed.
引用
收藏
页码:774 / 777
页数:4
相关论文
共 50 条
  • [31] Grazing incidence in-plane X-ray diffraction study on oriented copper phthalocyanine thin films
    Ofuji, Masato
    Inaba, Katsuhiko
    Omote, Kazuhiko
    Hoshi, Hajime
    Takanishi, Yoichi
    Ishikawa, Ken
    Takezoe, Hideo
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (08): : 5467 - 5471
  • [32] Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction
    Juraic, Krunoslav
    Gracin, Davor
    Djerdj, Igor
    Lausi, Andrea
    Ceh, Miran
    Balzar, Davor
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 284 : 78 - 82
  • [33] Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry
    Simbrunner, Josef
    Hofer, Sebastian
    Schrode, Benedikt
    Garmshausen, Yves
    Hecht, Stefan
    Resel, Roland
    Salzmann, Ingo
    Journal of Applied Crystallography, 2019,
  • [34] Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry
    Simbrunner, Josef
    Hofer, Sebastian
    Schrode, Benedikt
    Garmshausen, Yves
    Hecht, Stefan
    Resel, Roland
    Salzmann, Ingo
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 : 428 - 439
  • [35] Thermal transport in thin films measured by time-resolved, grazing incidence x-ray diffraction
    Walko, D. A.
    Sheu, Y. -M.
    Trigo, M.
    Reis, D. A.
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (10)
  • [36] Grazing incidence in-plane X-ray diffraction study on oriented copper phthalocyanine thin films
    Ofuji, M
    Inaba, K
    Omote, K
    Hoshi, H
    Takanishi, Y
    Ishikawa, K
    Takezoe, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (08): : 5467 - 5471
  • [37] Grazing incidence X-ray diffraction (GIRXD) study of the phase composition of SiCxFey and SiCxNyFez thin films
    R. V. Pushkarev
    N. I. Fainer
    K. K. Maurya
    Journal of Structural Chemistry, 2015, 56 : 1176 - 1178
  • [38] Unique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin films
    JordanSweet, JL
    Mooney, PM
    Lutz, MA
    Feenstra, RM
    Chu, JO
    LeGoues, FK
    JOURNAL OF APPLIED PHYSICS, 1996, 80 (01) : 89 - 96
  • [39] Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure
    Yoshida, Hiroyuki
    Sato, Naoki
    APPLIED PHYSICS LETTERS, 2006, 89 (10)
  • [40] Grazing-incidence X-ray scattering of lamellar thin films
    Smilgies, Detlef-M.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 (02) : 247 - 251