Testing the Tester, Common Pitfalls Testing Microprocessor Based Relays

被引:0
|
作者
Smith, Terrence [1 ]
Childers, Mike
Caldwell, Pat [2 ]
机构
[1] GE Digital Energy, Markham, ON, Canada
[2] Tennessee Valle Author, Knoxville, TN USA
来源
2014 67TH ANNUAL CONFERENCE FOR PROTECTIVE RELAY ENGINEERS | 2014年
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Microprocessor based relays have advanced algorithms in them to provide enhanced security against transients and other conditions that cannot actually exist on a real power system. This means that test methods should mimic real power system conditions, otherwise the relay may not operate or operate in an unpredictable manner for unrealistic conditions that are presented by a test set. This has given rise to the common phrase "test the tester". This paper will show common mistakes that are made when testing Microprocessor based relays with unrealistic power system conditions. The paper also explains why these conditions are unrealistic, and explains how typical relay algorithms respond to these conditions. Unrealistic tests to be explored will include: a step change in frequency for under-frequency testing, absence of pre-fault conditions when testing distance elements, change in voltage phase when testing distance elements, improperly set zero sequence compensation factors in test set software, and improper phase direction on bus protection.
引用
收藏
页码:618 / 626
页数:9
相关论文
共 50 条
  • [41] PITFALLS OF URODYNAMIC TESTING
    ODONNELL, PD
    UROLOGIC CLINICS OF NORTH AMERICA, 1991, 18 (02) : 257 - 268
  • [42] Pitfalls in Piezoresistivity Testing
    D. D. L. Chung
    Journal of Electronic Materials, 2022, 51 : 5473 - 5481
  • [43] Pitfalls of accelerated testing
    Meeker, WQ
    Escobar, LA
    IEEE TRANSACTIONS ON RELIABILITY, 1998, 47 (02) : 114 - 118
  • [44] Testing challenges of a multicore microprocessor
    Bushard, Louis
    Chelstrom, Nathan
    Ferguson, Steven
    Keller, Brion
    EE-EVALUATION ENGINEERING, 2007, 46 (02): : 12 - +
  • [45] MICROPROCESSOR SPEEDS SERVOVALVE TESTING
    STENGEL, RF
    DESIGN NEWS, 1977, 33 (18) : 80 - 81
  • [46] TESTING THE ANALOG MICROPROCESSOR.
    Hall, H.R.
    Digest of Papers - Semiconductor Test Symposium, 1979, : 234 - 236
  • [47] Testing of the Thermal Model of Microprocessor
    Markowski, Piotr
    Gierczak, Miroslaw
    Dziedzic, Andrzej
    2017 40TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE), 2017,
  • [48] TECHNIQUES FOR TESTING MICROPROCESSOR BOARDS
    BENNETTS, RG
    IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1981, 128 (07): : 473 - 491
  • [49] Teaching microprocessor design and testing
    Chang, JM
    FRONTIERS IN EDUCATION 1997 - 27TH ANNUAL CONFERENCE, PROCEEDINGS, BOLS I - III, 1997, : 1154 - 1157