Correlation between the growth-per-cycle and the surface hydroxyl group concentration in the atomic layer deposition of aluminum oxide from trimethylaluminum and water

被引:90
|
作者
Puurunen, RL
机构
[1] IMEC, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, INSYS, B-3001 Louvain, Belgium
关键词
atomic layer deposition; mechanism; aluminum oxide; high-kappa dielectrics;
D O I
10.1016/j.apsusc.2004.10.003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth-per-cycle (GPC) in the trimethylaluminum/water atomic layer deposition (ALD) process is shown to be quantitatively correlated with the surface OH group concentration before the trimethylaluminum reaction. The correlation corresponds to a reaction chemistry, where several types of gas-solid reactions (ligand exchange, dissociation/association) can occur simultaneously, and where steric hindrance by adsorbed methyl groups terminates the trimethylaluminum reaction. The commonly assumed reaction chemistry where one OH group bonds one aluminum atom through ligand exchange does not describe satisfactorily the trimethylaluminum/water process, and should perhaps not be expected to describe other ALD processes either. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:6 / 10
页数:5
相关论文
共 24 条
  • [21] High growth rate of erbium oxide thin films in atomic layer deposition from (CpMe)3Er and water precursors
    Päiväsaari, J
    Niinistö, J
    Arstila, K
    Kukli, K
    Putkonen, M
    Niinistö, L
    CHEMICAL VAPOR DEPOSITION, 2005, 11 (10) : 415 - 419
  • [22] GROWTH AND CHARACTERIZATION OF ALUMINUM-OXIDE THIN-FILMS DEPOSITED FROM VARIOUS SOURCE MATERIALS BY ATOMIC LAYER EPITAXY AND CHEMICAL VAPOR-DEPOSITION PROCESSES
    HILTUNEN, L
    KATTELUS, H
    LESKELA, M
    MAKELA, M
    NIINISTO, L
    NYKANEN, E
    SOININEN, P
    TIITTA, M
    MATERIALS CHEMISTRY AND PHYSICS, 1991, 28 (04) : 379 - 388
  • [23] Atomic layer deposition of molybdenum nitride from bis(tert-butylimido)-bis(dimethylamido)molybdenum and ammonia onto several types of substrate materials with equal growth per cycle
    Miikkulainen, Ville
    Suvanto, Mika
    Pakkanen, Tapani A.
    CHEMISTRY OF MATERIALS, 2007, 19 (02) : 263 - 269
  • [24] Correlation between SiO2 growth rate and difference in electronegativity of metal-oxide underlayers for plasma enhanced atomic layer deposition using tris(dimethylamino)silane precursor
    Maeda, Erika
    Nabatame, Toshihide
    Hirose, Masafumi
    Inoue, Mari
    Ohi, Akihiko
    Ikeda, Naoki
    Kiyono, Hajime
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (03):