Correlation between the growth-per-cycle and the surface hydroxyl group concentration in the atomic layer deposition of aluminum oxide from trimethylaluminum and water

被引:90
|
作者
Puurunen, RL
机构
[1] IMEC, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, INSYS, B-3001 Louvain, Belgium
关键词
atomic layer deposition; mechanism; aluminum oxide; high-kappa dielectrics;
D O I
10.1016/j.apsusc.2004.10.003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth-per-cycle (GPC) in the trimethylaluminum/water atomic layer deposition (ALD) process is shown to be quantitatively correlated with the surface OH group concentration before the trimethylaluminum reaction. The correlation corresponds to a reaction chemistry, where several types of gas-solid reactions (ligand exchange, dissociation/association) can occur simultaneously, and where steric hindrance by adsorbed methyl groups terminates the trimethylaluminum reaction. The commonly assumed reaction chemistry where one OH group bonds one aluminum atom through ligand exchange does not describe satisfactorily the trimethylaluminum/water process, and should perhaps not be expected to describe other ALD processes either. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:6 / 10
页数:5
相关论文
共 24 条
  • [1] Investigation of abnormally high growth-per-cycle in atomic layer deposition of Al2O3 using trimethylaluminum and water
    Ham, So-Yeon
    Jin, Zhenyu
    Shin, Seokhee
    Kim, Minseo
    Seo, Mingyu
    Min, Yo-Sep
    APPLIED SURFACE SCIENCE, 2022, 571
  • [2] Investigation of abnormally high growth-per-cycle in atomic layer deposition of Al2O3 using trimethylaluminum and water
    Ham, So-Yeon
    Jin, Zhenyu
    Shin, Seokhee
    Kim, Minseo
    Seo, Mingyu
    Min, Yo-Sep
    Applied Surface Science, 2022, 571
  • [3] Growth of Aluminum Molybdenum Oxide Films by Atomic Layer Deposition with Using Trimethylaluminum, Molybdenum Oxytetrachloride, and Water
    Maksumova, A. M.
    Bodalev, I. S.
    Suleimanov, S. I.
    Alikhanov, N. M. -R.
    Abdulagatov, I. M.
    Rabadanov, M. Kh.
    Abdulagatov, A. I.
    INORGANIC MATERIALS, 2023, 59 (04) : 369 - 378
  • [4] Growth of Aluminum Molybdenum Oxide Films by Atomic Layer Deposition with Using Trimethylaluminum, Molybdenum Oxytetrachloride, and Water
    A. M. Maksumova
    I. S. Bodalev
    S. I. Suleimanov
    N. M.-R. Alikhanov
    I. M. Abdulagatov
    M. Kh. Rabadanov
    A. I. Abdulagatov
    Inorganic Materials, 2023, 59 (4) : 369 - 378
  • [5] The Consequences of Random Sequential Adsorption for the Precursor Packing and Growth-Per-Cycle of Atomic Layer Deposition Processes
    Tezsevin, I.
    Deijkers, J. H.
    Merkx, M. J. M.
    Kessels, W. M. M.
    Sandoval, T. E.
    Mackus, A. J. M.
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2024, 15 (29): : 7496 - 7501
  • [6] Substrate Reactivity Effects in the Atomic Layer Deposition of Aluminum Oxide from Trimethylaluminum on Ruthenium
    Tallarida, Massimo
    Kukli, Kaupo
    Michling, Marcel
    Ritala, Mikko
    Leskela, Markku
    Schmeisser, Dieter
    CHEMISTRY OF MATERIALS, 2011, 23 (13) : 3159 - 3168
  • [7] Anomalously high alumina atomic layer deposition growth per cycle during trimethylaluminum under-dosing conditions
    Salami, Hossein
    Poissant, Andrew
    Adomaitis, Raymond A.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2017, 35 (01):
  • [8] Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion
    Ylivaara, Oili M. E.
    Liu, Xuwen
    Kilpi, Lauri
    Lyytinen, Jussi
    Schneider, Dieter
    Laitinen, Mikko
    Julin, Jaakko
    Ali, Saima
    Sintonen, Sakari
    Berdova, Maria
    Haimi, Eero
    Sajavaara, Timo
    Ronkainen, Helena
    Lipsanen, Harri
    Koskinen, Jari
    Hannula, Simo-Pekka
    Puurunen, Riikka L.
    THIN SOLID FILMS, 2014, 552 : 124 - 135
  • [9] In situ quartz crystal microbalance and quadrupole mass spectrometry studies of atomic layer deposition of aluminum oxide from trimethylaluminum and water
    Rahtu, A
    Alaranta, T
    Ritala, M
    LANGMUIR, 2001, 17 (21) : 6506 - 6509
  • [10] Modulation of the Growth Per Cycle in Atomic Layer Deposition Using Reversible Surface Functionalization
    Yanguas-Gil, Angel
    Libera, Joseph A.
    Elam, Jeffrey W.
    CHEMISTRY OF MATERIALS, 2013, 25 (24) : 4849 - 4860