Future trends in online testing: A new VLSI design paradigm?

被引：0
|
作者：
Nicolaidis, M
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1998年 / 15卷 / 04期
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暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：15 / 16
页数：2
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