Efficient optical proximity correction based on semi-implicit additive operator splitting

被引:20
|
作者
Shen, Yijiang [1 ]
Peng, Fei [1 ]
Zhang, Zhenrong [2 ,3 ]
机构
[1] Guangdong Univ Technol, Mega Educ Ctr South, Sch Automat, Guangzhou 510006, Guangdong, Peoples R China
[2] Guangxi Univ, Sch Comp Elect & Informat, Guangxi Key Lab Multimedia Commun & Network Techn, Nanning 530004, Peoples R China
[3] Guangxi Univ, Guangxi Key Lab Multimedia Commun & Network Techn, Nanning 530004, Peoples R China
基金
中国国家自然科学基金; 美国国家科学基金会;
关键词
MASK OPTIMIZATION; EDGE-DETECTION; NONLINEAR DIFFUSION; LITHOGRAPHIC SOURCE; PIXELATED SOURCE;
D O I
10.1364/OE.27.001520
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Inverse lithography techniques (ILT) have been extensively used by the semiconductor industry to compensate for the inherent image distortions in optical lithography. However, the iterative ILT optimization procedure requires rather prohibitive time steps leading to poor efficiency with explicit time discretization. In this paper, a semi-implicit time discretization scheme is applied, enabling stable computation of mask synthesis with large time steps. Additive operator sputtering (AOS) is implemented with respect to coordinate axes, reducing mask synthesis to consecutive one-dimensional updates represented by tridiagonal linear equations, which is solved efficiently by the Thomas algorithm. Simulation results merit the superiority of the proposed semi-implicit approach with improved convergence performance. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:1520 / 1528
页数:9
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