The morphology of 50% PET/PEN random copolymer as revealed by high resolution scanning electron microscopy and X-ray diffraction (vol 48, pg 4824, 2007)

被引：1
|
作者：
Abou-Kandil, Ahmed I. [1 ]
Windle, Alan H. [1 ]
机构：
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
来源：
POLYMER | 2007年 / 48卷 / 21期
关键词：
D O I：
10.1016/j.polymer.2007.08.055
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
引用
收藏
页码：6464 / 6465
页数：2
相关论文
共 50 条
  • [41] Dopant deactivation in heavily Sb doped Si (001): A high-resolution x-ray diffraction and transmission electron microscopy study
    Takamura, Y
    Vailionis, A
    Marshall, AF
    Griffin, PB
    Plummer, JD
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (09) : 5503 - 5507
  • [42] High-resolution x-ray diffraction, x-ray standing-wave, and transmission electron microscopy study of Sb-based single-quantum-well structures
    Mukhamedzhanov, EK
    Bocchi, C
    Franchi, S
    Baraldi, A
    Magnanini, R
    Nasi, L
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 4234 - 4239
  • [43] Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers (vol 50, pg 909, 2017)
    Opara, Nadia
    Martiel, Isabelle
    Arnold, Stefan A.
    Braun, Thomas
    Stahlberg, Henning
    Makita, Mikako
    David, Christian
    Padeste, Celestino
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 : 1460 - 1460
  • [44] β-Al4.5FeSi:: A combined synchrotron powder diffraction, electron diffraction, high-resolution electron microscopy and single-crystal X-ray diffraction study of a faulted structure
    Hansen, V
    Hauback, B
    Sundberg, M
    Romming, C
    Gjonnes, J
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1998, 54 : 351 - 357
  • [45] High-resolution x-ray diffraction and transmission electron microscopy of multiferroic BiFeO3 films -: art. no. 071913
    Qi, XD
    Wei, M
    Lin, Y
    Jia, QX
    Zhi, D
    Dho, J
    Blamire, MG
    MacManus-Driscoll, JL
    APPLIED PHYSICS LETTERS, 2005, 86 (07) : 1 - 3
  • [46] X-ray diffraction and high resolution transmission electron microscopy of 3C-SiC/AlN/6H-SiC(0001)
    J. H. Edgar
    Z. J. Yu
    David J. Smith
    J. Chaudhuri
    X. Cheng
    Journal of Electronic Materials, 1997, 26 : 1389 - 1393
  • [47] X-ray diffraction and high resolution transmission electron microscopy of 3C-SiC/AlN/6H-SiC(0001)
    Edgar, JH
    Yu, ZJ
    Smith, DJ
    Chaudhuri, J
    Cheng, X
    JOURNAL OF ELECTRONIC MATERIALS, 1997, 26 (12) : 1389 - 1393
  • [48] Structure of Nd10W22O81 from high-resolution electron microscopy and X-ray powder diffraction
    Grenthe, C
    Guagliardi, A
    Sundberg, M
    Werner, PE
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 2001, 57 (01): : 13 - 19
  • [49] Structural Studies of Technetium-Zirconium Alloys by X-ray Diffraction, High-Resolution Electron Microscopy, and First-Principles Calculations
    Poineau, Frederic
    Hartmann, Thomas
    Weck, Philippe F.
    Kim, Eunja
    Silva, G. W. Chinthaka
    Jarvinen, Gordon D.
    Czerwinski, Kenneth R.
    INORGANIC CHEMISTRY, 2010, 49 (04) : 1433 - 1438
  • [50] Microstructure of natural plywood-like ceramics: a study by high-resolution electron microscopy and energy-variable X-ray diffraction
    Pokroy, B
    Zolotoyabko, E
    JOURNAL OF MATERIALS CHEMISTRY, 2003, 13 (04) : 682 - 688
12345