This paper proposes a novel stochastic Fault Detection (FD) approach for the monitoring of Large-Scale Systems (LSSs) in a Plug-and-Play (PnP) scenario. The proposed architecture considers stochastic bounds on the measurement noises and modeling uncertainties, providing probabilistic time-varying FD thresholds with guaranteed false alarms probability levels. The monitored LSS consists of several interconnected subsystems and the designed FD architecture is able to manage plugging-in of novel subsystems and un-plugging of existing ones. Moreover, the proposed PnP approach can perform the unplugging of faulty subsystems in order to avoid the propagation of faults in the interconnected LSS. Analogously, once the issue has been solved, the disconnected subsystem can be re-plugged-in. The reconfiguration processes involve only local operations of neighboring subsystems, thus allowing a scalable architecture. A consensus approach is used for the estimation of variables shared among more than one subsystem; a method is proposed to define the time-varying consensus weights in order to allow PnP operations and to minimize at each step the variance of the uncertainty of the FD thresholds. Simulation results on a Power Network application show the effectiveness of the proposed approach.
机构:
NYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USANYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USA
Al-Shabili, Abdullah H.
Xu, Xiaojian
论文数: 0引用数: 0
h-index: 0
机构:
Washington Univ St Louis, Dept Comp Sci & Engn, St Louis, MO USANYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USA
Xu, Xiaojian
Selesnick, Ivan
论文数: 0引用数: 0
h-index: 0
机构:
NYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USANYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USA
Selesnick, Ivan
Kamilov, Ulugbek S.
论文数: 0引用数: 0
h-index: 0
机构:
Washington Univ St Louis, Dept Comp Sci & Engn, St Louis, MO USA
Washington Univ St Louis, Dept Elect & Syst Engn, St Louis, MO USANYU, Tandon Sch Engn, Dept Elect & Comp Engn, New York, NY 10012 USA
Kamilov, Ulugbek S.
2022 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, ICIP,
2022,
: 241
-
245