External microbeam set-up at the CNA (Sevilla) and its application to the study of Tartesic jewellery

被引:0
|
作者
Salamanca, MAO [1 ]
Ager, FJ
Ynsa, MD
Tubío, BMG
Respaldiza, MA
García-López, J
Fernández-Gómez, F
de la Bandera, ML
Grime, GW
机构
[1] Ctr Nacl Aceleradores, Parque Tecnol Cartuja 93,Avda Thomas A Edison S-N, E-41092 Seville, Spain
[2] Museo Arqueol Sevilla, E-41013 Seville, Spain
[3] Univ Seville, Dpto Prehist & Arqueol, E-41010 Seville, Spain
[4] Univ Oxford, Scanning Proton Microprobe Unit, Oxford OX1 3RH, England
关键词
PIXE; microprobe; external beam; archaeology; jewellery; gold; Tartesic;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new external microbeam system has been installed recently at the +45 degrees beam line of the 3 MV Pelletron accelerator at the Centro Nacional de Aceleradores (Sevilla, Spain). The facility, based on the system from Oxford Microbeams (OM), includes two sets of slits, a doublet of magnetic quadrupole focusing lenses, a Faraday cup and an accurate positioning device. In addition, a beam profile monitor (BPM) and a quartz viewer have been installed in the line to facilitate the microbeam production. The first PIXE application of the new facility was made in the field of Archaeometry, on the study of Tartesic gold artefacts (700-500 BC, SW of Spain) from Ebora and other archaeological sites. The aim of the analysis was to perform an exhaustive and systematic study about the soldering procedures that were employed by the goldsmiths along the Valley of Guadalquivir River after the Phoenician colonisation. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:664 / 669
页数:6
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