Absorption edge characteristics of GaAs, GaSb, InAs, and InSb

被引:21
|
作者
Schaefer, S. T. [1 ,2 ]
Gao, S. [1 ,2 ,3 ]
Webster, P. T. [4 ]
Kosireddy, R. R. [1 ,5 ]
Johnson, S. R. [1 ,2 ]
机构
[1] Arizona State Univ, Ctr Photon Innovat, Tempe, AZ 85287 USA
[2] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA
[3] Shandong Jiaotong Univ, Sch Sci, Jinan 250023, Shandong, Peoples R China
[4] Air Force Res Lab, Space Vehicles Directorate, Albuquerque, NM 87117 USA
[5] Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USA
关键词
P-TYPE GAAS; TEMPERATURE-DEPENDENCE; OPTICAL-ABSORPTION; ENERGY-GAP; BAND-STRUCTURE; N-TYPE; ELECTRON-TRANSPORT; MATRIX-ELEMENTS; PHOTOLUMINESCENCE; SEMICONDUCTORS;
D O I
10.1063/5.0003001
中图分类号
O59 [应用物理学];
学科分类号
摘要
The physical characteristics of the fundamental absorption edge of semi-insulating GaAs and unintentionally doped GaSb, InAs, and InSb are examined using spectroscopic ellipsometry. A five parameter model is developed to describe the key characteristics of the absorption edge. Among these parameters are the bandgap energy, the characteristic energy of the Urbach tail, and the absorption coefficient at the bandgap energy. The results indicate that the Coulomb interaction strongly influences the shape of the band edge with progressively less influence as the bandgap energy decreases. The energy dependence of the optical transition strength is observed to be nearly constant in narrow bandgap InSb.
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页数:14
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