Near-field microscopy of thermal radiation

被引：0
|
作者：
Kajihara, Yusuke [1 ]
Komiyama, Susumu [1 ]
Kosaka, Keishi [1 ]
机构：
[1] Univ Tokyo, Dept Basic Sci, Meguro Ku, Tokyo 1538902, Japan
来源：
2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS) | 2010年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have developed a scattering-type scanning near-field optical microscope with a charge sensitive infrared phototransistor. Near-field images of spontaneously emitted thermal radiation were clearly obtained and the spatial resolution was better than 300 nm. (C) 2010 Optical Society of America
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页数：2
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