Near-field microscopy of thermal radiation

被引：0
|
作者：
Kajihara, Yusuke [1 ]
Komiyama, Susumu [1 ]
Kosaka, Keishi [1 ]
机构：
[1] Univ Tokyo, Dept Basic Sci, Meguro Ku, Tokyo 1538902, Japan
来源：
2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS) | 2010年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have developed a scattering-type scanning near-field optical microscope with a charge sensitive infrared phototransistor. Near-field images of spontaneously emitted thermal radiation were clearly obtained and the spatial resolution was better than 300 nm. (C) 2010 Optical Society of America
引用
收藏
页数：2
相关论文
共 50 条
  • [1] Thermal imaging with near-field microscopy
    Boudreau, BD
    Raja, J
    Hocken, RJ
    Patterson, SR
    Patten, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (08): : 3096 - 3098
  • [2] Scanning near-field thermal microscopy
    Heiderhoff, R
    Altes, A
    Phang, JCH
    Balk, LJ
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2004, 1-2 : 63 - 70
  • [3] Near-field thermal radiation in a cavity
    Chen, Yong
    Xuan, Yimin
    INTERNATIONAL JOURNAL OF THERMAL SCIENCES, 2019, 142 : 305 - 315
  • [4] Probing near-field thermal radiation
    Kittel, Achim
    NATURE PHOTONICS, 2009, 3 (09) : 492 - 494
  • [5] Probing near-field thermal radiation
    Achim Kittel
    Nature Photonics, 2009, 3 : 492 - 494
  • [6] Near-Field Imaging of Thermal Radiation by Passive Millimeter-Wave Microscopy
    Ishino, Manabu
    Yoshida, Kentarou
    Nozokido, Tatuso
    2012 37TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2012,
  • [7] Multitip Near-Field Scanning Thermal Microscopy
    Ben-Abdallah, Philippe
    PHYSICAL REVIEW LETTERS, 2019, 123 (26)
  • [8] NEAR-FIELD MICROSCOPY AND NEAR-FIELD OPTICS
    COURJON, D
    BAINIER, C
    REPORTS ON PROGRESS IN PHYSICS, 1994, 57 (10) : 989 - 1028
  • [9] Scanning near-field optical microscopy and scanning thermal microscopy
    Pylkki, Russell J., 1600, JJAP, Minato-ku, Japan (33):
  • [10] SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SCANNING THERMAL MICROSCOPY
    PYLKKI, RJ
    MOYER, PJ
    WEST, PE
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3785 - 3790
12345