In-situ-ion milling in the Transmission Electron Microscope (TEM) using a liquid metal ion gun.

被引:0
|
作者
Gnauck, P [1 ]
Nisch, W [1 ]
Plies, E [1 ]
机构
[1] Nat & Med Sci Inst, D-72762 Reutlingen, Germany
关键词
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:515 / 516
页数:2
相关论文
共 50 条
  • [41] IN-SITU HEAVY-ION IRRADIATION IN ELECTRON-MICROSCOPE
    JOHNSON, E
    CARLSEN, F
    YTTERHUS, JA
    WOHLENBERG, T
    HENRIKSEN, L
    REVUE ROUMAINE DE PHYSIQUE, 1972, 17 (05): : 603 - +
  • [42] Observations of surface-related phenomena during in situ nanoindentation in a transmission electron microscope (TEM)
    Minor, AM
    Lilleodden, ET
    Stach, EA
    Morris, JW
    SURFACE ENGINEERING: SCIENCE AND TECHNOLOGY II, 2002, : 305 - 313
  • [43] New specimen preparation methods for materials transmission electron microscopy using ion-milling
    JEOL Co Ltd, Tokyo, Japan
    Electron Technol (Warsaw), 2 (183-188):
  • [44] IODINE ION MILLING OF COMPOUND SEMICONDUCTORS FOR TRANSMISSION ELECTRON-MICROSCOPY
    TANAKA, K
    MORI, M
    ISHIDA, Y
    TANINO, M
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 315 - 315
  • [45] Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling
    Tanabe, Toyokazu
    JOURNAL OF ELECTRON MICROSCOPY, 2011, 60 (01): : 35 - 37
  • [46] In situ observation of formation processes of titanium compound thin films due to ion implantation in a transmission electron microscope
    Kasukabe, Y
    Dizard, ZL
    Fujino, Y
    Tani, H
    Osaka, M
    Yamada, Y
    Abe, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 206 : 390 - 394
  • [47] TRANSMISSION ELECTRON-MICROSCOPE STUDY OF EFFECTS OF ION ETCHING ON CELLS
    FRISCH, B
    LEWIS, SM
    STUART, PR
    OSBORN, JS
    JOURNAL OF MICROSCOPY, 1975, 104 (AUG) : 219 - 233
  • [48] TRANSVERSE SECTIONING OF FIELD ION MICROSCOPE SPECIMENS FOR TRANSMISSION ELECTRON MICROSCOPY
    FRENCH, RD
    RICHMAN, MH
    ASM TRANSACTIONS QUARTERLY, 1968, 61 (01): : 190 - &
  • [49] Analysis of internal structure of mineral dust using focused ion beam and transmission electron microscope
    Ueda, Sayako
    Kato, Hiroki
    Miura, Kazuhiko
    29TH SYMPOSIUM ON AEROSOL SCIENCE AND TECHNOLOGY, 2012, 2012, : 201 - 202
  • [50] Development of electron optical system using annular pupils for scanning transmission electron microscope by focused ion beam
    Matsutani, Takaomi
    Yasumoto, Tsuchika
    Tanaka, Takeo
    Kawasaki, Tadahiro
    Ichihashi, Mikio
    Ikuta, Takashi
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 272 : 145 - 148