Single event effects results for candidate spacecraft electronics for NASA

被引：9

作者：

O'Bryan, MV ^{[1
]}

LaBel, KA ^{[1
]}

Howard, JW ^{[1
]}

Poivey, C ^{[1
]}

Ladbury, RL ^{[1
]}

Kniffin, SD ^{[1
]}

Buchner, SP ^{[1
]}

Xapsos, M ^{[1
]}

Reed, RA ^{[1
]}

Sanders, AB ^{[1
]}

Seidleck, CM ^{[1
]}

Marshall, CJ ^{[1
]}

Marshall, PW ^{[1
]}

Titus, J ^{[1
]}

McMorrow, D ^{[1
]}

Li, K ^{[1
]}

Gambles, J ^{[1
]}

Stone, RF ^{[1
]}

Patterson, JD ^{[1
]}

Kim, HS ^{[1
]}

Hawkins, DK ^{[1
]}

Carts, MA ^{[1
]}

Forney, JD ^{[1
]}

Irwin, T ^{[1
]}

Kahric, Z ^{[1
]}

Cox, SR ^{[1
]}

Palor, C ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Raytheon Informat Technol & Sci Serv, Greenbelt, MD 20771 USA

来源：

2003 IEEE RADIATION EFFECTS DATA WORKSHOP RECORD | 2003年

关键词：

D O I：

10.1109/REDW.2003.1281346

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.

引用

页码：65 / 76

页数：12

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