Fault area estimation via intelligent processing of fault-induced transients

被引:18
|
作者
Galijasevic, Z [1 ]
Abur, A [1 ]
机构
[1] Texas A&M Univ, Dept Elect Engn, College Stn, TX 77843 USA
关键词
ATP simulation; fault area estimation; fault-induced transients; intelligent computing; LOCATION; VOLTAGE; LINES;
D O I
10.1109/TPWRS.2003.814854
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a new method for estimating the fault area in electric power systems. The method is based on processing fault-induced electromagnetic transients through pattern matching. In this process, distinctive features of the recorded fault event are matched with the features of a large number of representative faults. The method originates from the concept of vulnerability contours which are used to assess the likelihood of voltage sags effecting a given network region.. A limited number of sparsely located voltage waveform recording devices is used. Intelligent computing techniques are used to identify the most likely fault area. The method is aimed at complementing an earlier-developed technique for estimating fault location based on phasor voltage measurements [12]. Good performance of the method is demonstrated through several examples using ATP simulations.
引用
收藏
页码:1241 / 1247
页数:7
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