Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials

被引：1

作者：

Del Rosso, T. ^{[1
]}

Grando, D. ^{[2
,3
]}

Marsili, P. ^{[1
]}

Giammanco, F. ^{[1
]}

机构：

[1] Univ Pisa, Dept Phys, I-56127 Pisa, Italy

[2] Univ Pavia, Dept Elect, I-27100 Pavia, Italy

[3] CNR, CNISM, I-00185 Rome, Italy

来源：

OPTICS LETTERS | 2011年 / 36卷 / 08期

关键词：

LITHIUM-NIOBATE; CRYSTALS;

D O I：

10.1364/OL.36.001437

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Second-harmonic interferometry (SHI) is proposed for measuring the electro-optic (EO) coefficients of massive media. It combines the advantages of interferometric techniques with the mechanical stability of single-beam methods, simultaneously skimming the wavelength dispersion of the EO response. For demonstrating the effectiveness of the SHI technique, the EO coefficients r(33)(T) and r(13)(T) of the EO crystal lithium niobate are measured simultaneously at 1064 and 532nm. (C) 2011 Optical Society of America

引用

页码：1437 / 1439

页数：3

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