Real-time observation of electron-beam induced mass transport in strained InGaAs/AlGaAs layers on GaAs (100) and (311)B substrates

被引:5
|
作者
Ogawa, T [1 ]
Akabori, M [1 ]
Motohisa, J [1 ]
Fukui, T [1 ]
机构
[1] Hokkaido Univ, Res Ctr Interface Quantum Elect, Kita Ku, Sapporo, Hokkaido 0608628, Japan
关键词
strained InGaAs/AlGaAs layers; electron-beam irradiation; mass transport; surface deformation; quantum disk;
D O I
10.1143/JJAP.38.1040
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied surface deformation due to electron-beam irradiation in strained InGaAs/AlGaAs layers grown on GaAs (100) and (311)B planes in a horizontal low-pressure metalorganic vapor phase epitaxy system at about 800 degrees C. The surface deformation was observed in real time using a high-resolution scanning electron microscope at a magnification of 300,000. The surface deformation occurred from the inside of InGaAs/AlGaAs grown layer under the electron-beam irradiated area with the accelerating voltage of 30 kV and the scanning time ranging from 60 to 120 s. The surface deformation was not consist of amorphous-carbon contamination. The mass transport seems to be caused by the residual strain relaxation due to electron-beam irradiation.
引用
收藏
页码:1040 / 1043
页数:4
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