Surface softness characterization of a novel biomimetic silicone hydrogel contact lens using an atomic force microscopy indentation method

被引：0
|
作者：
Sharma, Vinay [1 ]
Shi, Charlie Xinfeng [1 ]
Wu, James [1 ]
机构：
[1] Alcon Res Inst, Ft Worth, TX USA
来源：
INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE | 2022年 / 63卷 / 07期
关键词：
D O I：
暂无
中图分类号：
R77 [眼科学];
学科分类号：
100212 ;
摘要：
530 - A022
引用
收藏
页数：2
相关论文
共 50 条
  • [41] Surface characterization of atactic poly(methyl methacrylate) aggregates using atomic force microscopy
    Wang, JJ
    Luo, YH
    Shen, DY
    POLYMER JOURNAL, 2002, 34 (06) : 471 - 473
  • [42] Surface Characterization of Atactic Poly(methyl methacrylate) Aggregates Using Atomic Force Microscopy
    Jijun Wang
    Yanhong Luo
    Deyan Shen
    Polymer Journal, 2002, 34 : 471 - 473
  • [43] Novel tip modification method for measurement of the adhesive force between a silanized surface and a locally modified tip using atomic force microscopy
    Seung Pil Han
    Kosaku Suga
    Masamichi Fujihira
    Byung-Eun Park
    Journal of the Korean Physical Society, 2014, 64 : 63 - 68
  • [44] Novel tip modification method for measurement of the adhesive force between a silanized surface and a locally modified tip using atomic force microscopy
    Han, Seung Pil
    Suga, Kosaku
    Fujihira, Masamichi
    Park, Byung-Eun
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2014, 64 (01) : 63 - 68
  • [45] Local indentation modulus characterization of diamondlike carbon films by atomic force acoustic microscopy two contact resonance frequencies imaging technique
    Passeri, D
    Bettucci, A
    Germano, M
    Rossi, M
    Alippi, A
    Sessa, V
    Fiori, A
    Tamburri, E
    Terranova, ML
    APPLIED PHYSICS LETTERS, 2006, 88 (12)
  • [46] Quantitative determination of surface energry using atomic force microscopy: the case of hydrophobic/hydrophobic contact and hydrophilic/hydrophilic contact
    Awada, H
    Castelein, G
    Brogly, M
    SURFACE AND INTERFACE ANALYSIS, 2005, 37 (09) : 755 - 764
  • [47] A New Method for Characterization of Natural Zeolites and Organic Nanostructure Using Atomic Force Microscopy
    Fuoco, Domenico
    NANOMATERIALS, 2012, 2 (01): : 79 - 91
  • [48] A Method for Dispersion Degree Characterization Using Electro Conductive Mode of Atomic Force Microscopy
    Berzina, Astrida
    Tupureina, Velta
    Klemenoks, Igors
    Knite, Maris
    ICTE 2016, 2017, 104 : 338 - 345
  • [49] Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip
    H. Hosoi
    M. Kimura
    K. Hayakawa
    K. Sueoka
    K. Mukasa
    Applied Physics A, 2001, 72 : S23 - S26
  • [50] Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip
    Hosoi, H.
    Kimura, M.
    Hayakawa, K.
    Sueoka, K.
    Mukasa, K.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (Suppl 1): : S23 - S26
12345