The absorbance deviation method: a spectrophotometric estimation of the critical micelle concentration (CMC) of ethoxylated alkylphenol surfactants

被引：38
|
作者：
Ysambertt, F
Vejar, F
Paredes, J
Salager, JL [1 ]
机构：
[1] Univ Los Andes, Lab FIRP, Merida 5101, Venezuela
[2] Univ Zulia, Fac Ciencias, Dept Quim, Lab PSAS, Maracaibo, Venezuela
来源：
COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 1998年 / 137卷 / 1-3期
关键词：
critical micelle concentration; ethoxylated alkylphenol; spectrophotometry;
D O I：
10.1016/S0927-7757(97)00203-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The measurement of spectroscopic absorbance at a proper wavelength can lead to the determination of the CMC of ethoxylated alkylphenol through the so-called absorbance deviation method. This method is based on the slight change in the absorbance-concentration trend, which takes place at the CMC. The accuracy of the spectrophotometric measurement allows calculation of the deviation between the two trends and extrapolation of it to zero deviation in order to estimate the CMC. The CMC estimates are satisfactory; the method may be an alternative technique for alkylphenol nonionic surfactants. (C) 1998 Elsevier Science B.V.
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页码：189 / 196
页数：8
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