Raman scattering enhancement of dielectric microspheres on silicon nitride film

被引:6
|
作者
Ogura, Toshihiko [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Hlth & Med Res Inst, Cent 6, Higashi 1-1-1, Tsukuba, Ibaraki 3058566, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
REFRACTIVE-INDEX; EMISSION; CAVITY; NANOPARTICLES; SIZE;
D O I
10.1038/s41598-022-09315-5
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Circulating light in the total internal reflection within dielectric spheres or disks is called the whispering gallery mode (WGM), which by itself is highly sensitive to its surface and capable of detecting viruses and single atomic ions. The detection site of the sensors using WGM is created by the evanescent light from the circulating light inside spheres. Here we report anomalous Raman scattering enhancement in dielectric microspheres on a silicon nitride (SiN) film. This Raman enhancement occurs at the periphery of the spheres, and a similar ring of light was also observed under a fluorescence microscope. This is caused by the light circulating around the dielectric spheres as in the WGM. We observed anomalously enhanced Raman spectrum at the periphery of 3 mu m diameter polystyrene (PS) microspheres on a SiN film using confocal laser Raman microscopy. The wavelength intensity of this enhanced Raman spectrum was accompanied by periodic changes due to interference. These features may lead to the development of high-sensitive sensors and optical devices.
引用
收藏
页数:11
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