Atomic-scale structure of glasses using high-energy X-ray diffraction

被引：6
|
作者：
Petkov, V [1 ]
机构：
[1] Cent Michigan Univ, Dept Phys, Mt Pleasant, MI 48858 USA
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 2005年 / 88卷 / 09期
关键词：
D O I：
10.1111/j.1551-2916.2005.00135.x
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The great potential of high-energy X-ray diffraction to determine fine details in the atomic scale structure is discussed and illustrated with an example of a successful study on GeSe2 glass.
引用
收藏
页码：2528 / 2531
页数：4
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