A Fast Scrubbing Method Based on Triple Modular Redundancy for SRAM-Based FPGAs

被引：0

作者：

Zhang, Rong-Sheng ^{[1
]}

Xiao, Li-Yi ^{[1
]}

Cao, Xue-Bing ^{[1
]}

Li, Jie ^{[1
]}

Li, Jia-Qiang ^{[1
]}

Li, Lin-Zhe ^{[1
]}

机构：

[1] Harbin Inst Technol, Microelect Ctr, Harbin 150001, Heilongjiang, Peoples R China

来源：

2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT) | 2018年

关键词：

SRAM-based FPGAs; reliability; scrubbing; fault injection; ALPHA MAGNETIC SPECTROMETER; DIGITAL SIGNAL PROCESSOR;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In recent years, SRAM-based FPGAs (Field Programmable Gate Arrays) have been popular in space applications because of their high speed and reconfigurability. The specific structure cell SRAM (Static Random Access Memory) not only speed up the user design but also speed up the configuration and reconfiguration. However, SRAM is very sensitive to the space particles that can change the value stored in SRAM. For improving the reliability of user design in SRAM-based FPGA, this paper proposes a scrubbing method based on TMR (Triple Modular Redundancy) for SRAM-based FPGAs. This method improves the reliability of TMR design by reducing the possibility of SEUs accumulation. We test the proposed scrubbing method through fault injection and the experimental results indicate the proposed scrubbing method can improve the reliability of TMR design in SRAM-based FPGAs.

引用

页码：1291 / 1293

页数：3

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