Microstructure of yttrium stabilized ZrO2 crystals with CeO2 and SrTiO3 intermediate layers

被引：5
|
作者：
Roddatis, VV
Vasiliev, AL
Stepantsov, EA
Kiselev, NA
Olsson, E
Ivanov, ZG
Claeson, T
机构：
[1] Russian Acad Sci, Inst Cristallog, Moscow 117333, Russia
[2] Chalmers Univ Technol, S-41296 Gothenburg, Sweden
来源：
THIN SOLID FILMS | 1998年 / 333卷 / 1-2期
关键词：
yttrium stabilized ZrO2 crystals; intermediate layers; CeO2; SrTiO3;
D O I：
10.1016/S0040-6090(98)00559-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The structure of yttrium stabilized ZrO2 crystals with intermediate seam layers of CeO2 and SrTiO3 has been studied by transmission electron microscopy (TEM). Such crystals were fabricated by the solid phase intergrowth method (SPI). The interfaces between ZrO2 and CeO2 layers were blurred compared to the sharp interfaces between CeO2 and SrTiO3 layers. The CeO2 layers were single crystalline with a high density of defects. The SrTiO3 layers consisted of columnar grains. Epitaxial relationships have been established. (C) 1998 Elsevier Science S.A. All rights reserved.
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收藏
页码：207 / 212
页数：6
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