In situ study of surface reactions by X-ray photoemission spectroscopy

被引：0

作者：

Rochet, Francois ^{[1
]}

Gallet, Jean-Jacques ^{[1
]}

Bournel, Fabrice ^{[1
]}

Sirotti, Fausto ^{[2
]}

机构：

[1] Univ Paris 06, Equipe Surfaces Fonctionnalisees, Lab Chim Phys Matiere & Rayonnement, CNRS,UMR 7614, F-75231 Paris 05, France

[2] Synchrotron SOLEIL, CNRS, F-91192 Gif Sur Yvette, France

来源：

ACTUALITE CHIMIQUE | 2011年 / 356-57期

关键词：

Reactivity; surface; synchrotron radiation; electron spectroscopies; in situ measurements; real time; near ambient pressure; PHOTOELECTRON-SPECTROSCOPY; AMBIENT-PRESSURE; OXIDATION;

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

In situ study of surface reactions by X-ray photoemission spectroscopy Recent advances in X-ray photoemission spectroscopy (XPS) in the monitoring of surface reactions in real time on a sub-second scale and in the presence of a gas phase, up to pressures close to the ambient, are presented in this article. These developments are illustrated with examples from recent experiments conducted with synchrotron light sources, and underline the new prospects in catalysis and environmental chemistry.

引用

页码：29 / 33

页数：5

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