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Accurate Standard Cell Characterization and Statistical Timing Analysis using Multivariate Adaptive Regression Splines
被引:0
|作者:
Liu, Taizhi
[1
]
Chen, Chang-Chih
[1
]
Milor, Linda
[1
]
机构:
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
来源:
PROCEEDINGS OF THE SIXTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2015)
|
2015年
基金:
美国国家科学基金会;
关键词:
Standard cell characterization;
statistical timing analysis;
IMPACT;
MODELS;
D O I:
暂无
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
This paper proposes a methodology for standard cell characterization which contains three models: an input capacitance model, a sensitivity model for variational resistive-capacitive loads, and gate and interconnect delay models via multivariate adaptive regression splines (MARS). Our MARS-based methodology has several advantages. Firstly, MARS captures nonlinearities and interactions for high-dimensional problems. Secondly, MARS is an adaptive and intelligent procedure that can 'filter out' negligible parameters without manual intervention while characterizing a complex cell with over 40 devices. Thirdly, our timing methodology has implemented block-based statistical timing analysis (StTA) (for path selection) and path-based StTA (for timing accuracy). We verified our method by comparing our results to SPICE using ten ISCAS85 benchmark circuits. The average errors in the circuit-delay mean and standard deviation (SD) are 1.47% and -1.15% respectively. We also compared our method with traditional quadratic delay models and achieve significant accuracy improvement and consume 38% less run time.
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页码:272 / 279
页数:8
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