The application of the boundary-scan testing technology based on genetic algorithms

被引：0
|
作者：
He, J [1 ]
Zhang, CF [1 ]
Long, YH [1 ]
机构：
[1] Zhuzhou Inst Technol, Dept Elect Engn, Hunan 412008, Peoples R China
来源：
ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3 | 2003年
关键词：
boundary scan; genetic algorithm; PCB test;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
dThe boundary-scan testing technology is proposed in this paper. It can optimize the testing vectors globally with the global optimality of genetic algorithms. Firstly the developing course of boundary-scan testing technology is introduced. Through the analysis of architecture and function of system, it indicates that on the premise of maintaining high fault coverage, to search an optimal interconnected testing aggregate, to improve the testing speed and compress the testing vectors is one of the keys of efficient boundary-scan test in engineering application. Secondly the basic concept, operation steps and the realization of global optimality of genetic algorithms are introduced and analyzed. Thirdly, the project of designing testing vectors of boundary-scan test with genetic algorithms is introduced. Through this project the optimal testing vectors can obtained with less complexity and better categoricalness. Finally a testing circuit board has been designed with the testing designing method. The result of the experiment showed the efficiency of this testing algorithm.
引用
收藏
页码：1424 / 1429
页数：6
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