Constitutive Behavior of Mixed Sn-Pb/Sn-3.0Ag-0.5Cu Solder Alloys

被引:11
|
作者
Tucker, J. P. [1 ]
Chan, D. K. [1 ]
Subbarayan, G. [1 ]
Handwerker, C. A. [1 ]
机构
[1] Purdue Univ, W Lafayette, IN 47907 USA
关键词
Sn-Ag-Cu solder alloy; Sn-Pb solder alloy; constitutive behavior; CREEP; MODEL; PB; DEFORMATION; MODULUS;
D O I
10.1007/s11664-011-1812-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
During the transition from Pb-containing solders to Pb-free solders, joints composed of a mixture of Sn-Pb and Sn-Ag-Cu often result from either mixed assemblies or rework. Comprehensive characterization of the mechanical behavior of these mixed solder alloys resulting in a deformationally complete constitutive description is necessary to predict failure of mixed alloy solder joints. Three alloys with 1 wt.%, 5 wt.%, and 20 wt.% Pb were selected so as to represent reasonable ranges of Pb contamination expected from different 63Sn-37Pb components mixed with Sn-3.0Ag-0.5Cu. Creep and displacement-controlled tests were performed on specially designed assemblies at temperatures of 25A degrees C, 75A degrees C, and 125A degrees C using a double lap shear test setup that ensures a nearly homogeneous state of plastic strain at the joint interface. The observed changes in creep and tensile behavior with Pb additions were related to phase equilibria and microstructure differences observed through differential scanning calorimetric and scanning electron microscopic cross-sectional analysis. As Pb content increased, the steady-state creep strain rates increased, and primary creep decreased. Even 1 wt.% Pb addition was sufficient to induce substantially large creep strains relative to the Sn-3.0Ag-0.5Cu alloy. We describe rate-dependent constitutive models for Pb-contaminated Sn-Ag-Cu solder alloys, ranging from the traditional time-hardening creep model to the viscoplastic Anand model. We illustrate the utility of these constitutive models by examining the inelastic response of a chip-scale package (CSP) under thermomechanical loading through finite-element analysis. The models predict that, as Pb content increases, total inelastic dissipation decreases.
引用
收藏
页码:596 / 610
页数:15
相关论文
共 50 条
  • [11] Microstructural evolution and tensile properties of Sn-Ag-Cu mixed with Sn-Pb solder alloys
    Wang, Fengjang
    O'Keefe, Matthew
    Brinkmeyer, Brandon
    JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 477 (1-2) : 267 - 273
  • [12] Constitutive and Aging Behavior of Sn3.0Ag0.5Cu Solder Alloy
    Mysore, Kaushik
    Subbarayan, Ganesh
    Gupta, Vikas
    Zhang, Ron
    IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2009, 32 (04): : 221 - 232
  • [13] Fabrication and characterization of Sn-3.0Ag-0.5Cu, Sn-0.7Cu and Sn-0.3Ag-0.5Cu alloys
    Lee, Jung-Il
    Paeng, Jong Min
    Cho, Hyun Su
    Yang, Su Min
    Ryu, Jeong Ho
    JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY, 2018, 28 (03): : 130 - 134
  • [14] Cu aggregation behavior on interfacial reaction of Sn-3.0Ag-0.5Cu/ENIG solder joints
    Sun, Qian
    Wang, Jie
    Wang, Xiao-Nan
    Zhou, Xing-Wen
    Tang, Xiao-Xia
    Akira, Kato
    MATERIALS LETTERS, 2023, 348
  • [15] Mechanical Behavior of Sn-3.0Ag-0.5Cu/Cu Solder Joints After Isothermal Aging
    Van Luong Nguyen
    Chin-Sung Chung
    Ho-Kyung Kim
    Journal of Electronic Materials, 2016, 45 : 125 - 135
  • [16] Mechanical Behavior of Sn-3.0Ag-0.5Cu/Cu Solder Joints After Isothermal Aging
    Van Luong Nguyen
    Chung, Chin-Sung
    Kim, Ho-Kyung
    JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (01) : 125 - 135
  • [17] Corrosion behavior of Sn-3.0Ag-0.5Cu lead-free solder joints
    Wang, Mingna
    Wang, Jianqiu
    Ke, Wei
    MICROELECTRONICS RELIABILITY, 2017, 73 : 69 - 75
  • [18] SN-3.0AG-0.5CU COMPOSITE SOLDER REINFORCED BY MULTILAYER GRAPHENE
    Huang, Yilong
    Xiu, Ziyang
    Tian, Yanhong
    2016 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE (CSTIC), 2016,
  • [19] Interfacial behaviors of Sn-Pb, Sn-Ag-Cu Pb-free and mixed Sn-Ag-Cu/Sn-Pb solder joints during electromigration
    Wang, Fengjiang
    Li, Dongyang
    Tian, Shuang
    Zhang, Zhijie
    Wang, Jiheng
    Yan, Chao
    MICROELECTRONICS RELIABILITY, 2017, 73 : 106 - 115
  • [20] The Morphology of Pb-free Sn-3.0Ag-0.5Cu Solder Reinforced by NiO Nanoparticles
    Omar, Fakhrul Rifdi
    Salleh, Emee Marina
    Othman, Norinsan Kamil
    Ani, Fakhrozi Che
    Samsudin, Zambri
    2018 UKM FST POSTGRADUATE COLLOQUIUM, 2019, 2111