Replicating nanostructures on silicon by low-energy ion beams

被引:7
|
作者
Satpati, B [1 ]
Dev, BN [1 ]
机构
[1] Inst Phys, Bhubaneswar 751005, Orissa, India
关键词
D O I
10.1088/0957-4484/16/4/039
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report on a nanoscale patterning method on Si substrates using self-assembled metal islands and low-energy ion-beam irradiation. The Si nanostructures produced on the Si substrate have a one-to-one correspondence with the self-assembled metal (Ag, An, Pt) nanoislands initially grown on the substrate. The surface morphology and the structure of the irradiated surface were studied by high-resolution transmission electron microscopy (HRTEM). TEM images of ion-beam irradiated samples show the formation of sawtooth-like structures on Si. Removing metal islands and the ion-beam induced amorphous Si by etching, we obtain a crystalline nanostructure of Si. The smallest structures emit red light when exposed to a UV light. The size of the nanostructures on Si is governed by the size of the self-assembled metal nanoparticles grown on the substrate for this replica nanopatterning. The method can easily be extended for tuning the size of the Si nanostructures by the proper choice of the metal nanoparticles and the ion energy in ion irradiation. It is suggested that off-normal irradiation can also be used for tuning the size of the nanostructures.
引用
收藏
页码:572 / 578
页数:7
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