Characteristics of triode magnetron sputtering: the morphology of deposited titanium films

被引:41
|
作者
Fontana, LC
Muzart, JLR [1 ]
机构
[1] Univ Fed Santa Catarina, Dept Engn Mecan, LABMAT, BR-88040900 Florianopolis, SC, Brazil
[2] FEJ, UDESC, Dept Fis, BR-89223100 Joinville, SC, Brazil
来源
SURFACE & COATINGS TECHNOLOGY | 1998年 / 107卷 / 01期
关键词
triode magnetron sputtering; titanium films;
D O I
10.1016/S0257-8972(98)00576-3
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper presents a modification to conventional diode magnetron sputtering systems that results in higher ionisation rates with a consequent possibility of maintaining the discharge at lower pressures. The introduction of a grounded or positively biased grid in front of the target increases the target current substantially compared with the diode configuration. In addition, the discharge can be maintained at a lower target voltage, thus increasing the range of deposition rate. With a low-pressure discharge maintained during him deposition, the mean free path of the sputtered atoms increases. As a consequence, they reach the substrate with a high energy and, thus, a high-density film is obtained. Therefore, by using the triode magnetron configuration and setting the substrate temperature to 100 degrees C, it is possible to deposit a titanium film having a similar morphology to one deposited in the diode system at 400 degrees C. Finally, the electrode placed in front of the cathode probably produces a more homogeneous spatial distribution of electron density, resulting in a significantly higher discharge stability in the triode configuration. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:24 / 30
页数:7
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