EMC: Where power and test converge

被引：0

作者：

Keeton, G ^{[1
]}

机构：

[1] Elgar Elect, San Diego, CA 92121 USA

来源：

EE-EVALUATION ENGINEERING | 2003年 / 42卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

To be competitive in today's test industry, it's time to consider Ways that combine divergent compliance testing needs and still simulate real-world conditions.

引用

页码：26 / +

页数：4

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