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EMC: Where power and test converge
被引:0
|作者:
Keeton, G
[1
]
机构:
[1] Elgar Elect, San Diego, CA 92121 USA
来源:
关键词:
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
To be competitive in today's test industry, it's time to consider Ways that combine divergent compliance testing needs and still simulate real-world conditions.
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页码:26 / +
页数:4
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