Determination and simulation of nanoscale energy dissipation processes in amplitude modulation AFM

被引:55
|
作者
Gomez, Carlos J. [1 ]
Garcia, Ricardo [1 ]
机构
[1] Inst Microelect Madrid SIC, Madrid 28760, Spain
关键词
Phase imaging AFM; Amplitude modulation AFM; Energy dissipation; Force microscopy; PHASE-CONTRAST; FORCE MICROSCOPY; TRANSITIONS; SURFACE;
D O I
10.1016/j.ultramic.2010.02.023
中图分类号
TH742 [显微镜];
学科分类号
摘要
We develop a theoretical framework that explains the use of amplitude modulation AFM to measure and identify energy dissipation processes at the nanoscale. The variation of the dissipated energy on a surface by a vibrating tip as a function of its amplitude has a shape that singles out the dissipative process. The method is illustrated by calculating the dynamic-dissipation curves for surface adhesion energy hysteresis, long-range interfacial interactions and viscoelastic processes. We also show that by diving the dissipated energy by its maximum value, the dynamic-dissipation curves become independent of the experimental parameters. In particular, for long-range dissipative processes we have derived an analytical relationship that shows the independence of the normalized dynamic-dissipation curves with respect the free amplitude, cantilever constant or quality factor. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:626 / 633
页数:8
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