共 50 条
- [1] 300mm factory automation experience and challenges for wafer foundry fabs 2001 IEEE INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING, CONFERENCE PROCEEDINGS, 2001, : 377 - 380
- [4] 300mm fab automation technology options and selection criteria 1997 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP - ASMC 97 PROCEEDINGS: THEME - THE QUEST FOR SEMICONDUCTOR MANUFACTURING EXCELLENCE: LEADING THE CHARGE INTO THE 21ST CENTURY, 1997, : 373 - 379
- [6] Contamination control in 300mm foundry 2002 SEMICONDUCTOR MANUFACTURING TECHNOLOGY WORKSHOP, 2002, : 212 - 214
- [7] CIM for 300mm semiconductor fab PROCESS, EQUIPMENT, AND MATERIALS CONTROL IN INTEGRATED CIRCUIT MANUFACTURING III, 1997, 3213 : 162 - 170
- [8] Smart Sampling Methodology for Yield Defect Inspection in a 200mm Foundry Wafer Fab 2018 INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING (ISSM), 2018,
- [9] 300mm full automation integration test methodology and experience 2002 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS I-IV, PROCEEDINGS, 2002, : 3613 - 3618
- [10] Integrating dynamic fab capacity and automation models for 300mm semiconductor manufacturing PROCEEDINGS OF THE 2000 WINTER SIMULATION CONFERENCE, VOLS 1 AND 2, 2000, : 1505 - 1509